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Beilstein J. Nanotechnol. 2016, 7, 102–110, doi:10.3762/bjnano.7.12
Scheme 1: a) Structural formula of the α-methyl-ω-p-vinyl-benzoate-polystyrene molecule. b) Schematic represe...
Figure 1: AFM height images and corresponding cross sections of a) a Si wafer and b) a PS brush.
Figure 2: ζ-potential of the Si wafer and the PS brush before and after modification measured in water.
Scheme 2: Mechanism of the proposed transesterification process, which modifies the polystyrene brush in the ...
Figure 3: ATR spectra of PS powder used for the preparation of the brushes before and after modification. The...
Figure 4: XRD diagrams of ZnO films deposited on a) SiOx and b) PS brushes after 20 mineralization cycles. Th...
Figure 5: a) AFM topography and cross section of ZnO islands deposited on SiOx after 20 mineralization cycles...
Beilstein J. Nanotechnol. 2015, 6, 1763–1768, doi:10.3762/bjnano.6.180
Figure 1: Self-assembly of ZnO-containing material on prepatterned substrates. (a) Schematic representation o...
Figure 2: Deposition mechanism of mineralized ZnO nanoparticles on amino SAMs. The negative charges represent...